Química Analítica: Um Jornal Indiano
ISSN (PRINT): 0974-7419

Abstrato

Application Of Atomic Force Microscopy For The Study Of Friction Properties Of Surfaces

S.Sadegh Hassani and E.Ebrahimpoor Ziaie


In this paper, a brief description of lateral force microscopy and the most important aspects, which must be considered in LFM experiments and analysis, are presented. Material-induced and topography-induced friction and the way of recognizing them, the procedure for measuring of lateral force and the different methods for calibrating cantilever force constant are some aspects, which have been given. ï›™ 2005 Trade Science Inc. - INDIA


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